The third edition of India Electronics Week (IEW) 2018, started yesterday at the Karnataka Trade Promotion Organization (KTPO) in Bengaluru. Today marks the second day of the third edition of India Electronics Week and second edition of EFY Conferences. After a successful first day, day-two also offers discussion sessions, workshops and interaction opportunities on some of the hottest topics in the industry at present.
The day started off with a panel discussion on a major subject – “The security threats in IoT paradigm – a hype or a scary reality?” Narang N Kishor, founder, Narnix Technolabs Pvt. Ltd, and chairman of LITD 28 on smart infrastructure, Bureau of Indian Standards, took the stage as the moderator. The panel included imminent industry personalities like Deepu Chandran, technical manager, LDRA Technology Pvt Ltd.; Benoy CS, director,Digital Transformation(ICT) Practice, Frost & Sullivan; Sunil David, regional director (IoT), AT&T India; Tulika Pandey, director, Computer Emergency Response Team – India (CERT-IN), Ministry Of Electronics & Information Technology; Sivakumar Natarajan, global practice head of digital manufacturing and technology strategic business unit, Wipro and Venkatesh Kumaran, senior director, ARM. IoT deployments are quite vulnerable to security threats, if it is not thought out carefully. Focusing on this issue, the panelists answered a major query each IoT design engineer might have – how much security is optimum for their products? The panel discussion provided a 360-degree view of security implications in various aspects of the IoT paradigm.
This panel discussion was followed by another fruitful session. Sapna Mongia, Head -Smart Grids and Metering, South Asia, Power and Discrete, STMicroelectronics, spoke on the topic ‘Adopt the best IoT practices from around the world for smart cities’.
As the day progresses, KTPO will witness more discussion sessions where panelists and speakers will share groundbreaking information that will have the potential to transform business and solution models.
— By Baishakhi Dutta
